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Instant diagnosis with X-ray visionCROFT, Sally.Materials world. 2000, Vol 8, Num 11, pp 15-16, issn 0967-8638Article

Scanning system for high-energy electron diffractometryAVILOV, A. S; KULIGIN, A. K; PIETSCH, U et al.Journal of applied crystallography. 1999, Vol 32, pp 1033-1038, issn 0021-8898, 6Article

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Explosive phenomenon during the interaction of NO with AgBÄR, T; VISART DE BOCARME, T; KRUSE, N et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 245-249, issn 0304-3991Conference Paper

FIM studies of clean and graphitized rhodium using lithium and oxygen as imaging speciesMEDVEDEV, V. K; SUCHORSKI, Yu; VISART DE BOCARME, T et al.Ultramicroscopy. 1999, Vol 79, Num 1-4, pp 239-244, issn 0304-3991Conference Paper

Static SIMS : ion detection efficiencies in a channel electron multiplierGILMORE, I. S; SEAH, M. P.Applied surface science. 1999, Vol 144-45, pp 113-117, issn 0169-4332Conference Paper

Amplitude contrast : A way to obtain directly interpretable high-resolution images in a spherical aberration corrected transmission electron microscopeFOSCHEPOTH, M; KOHL, H.Physica status solidi. A. Applied research. 1998, Vol 166, Num 1, pp 357-366, issn 0031-8965Article

Field ion specimen preparation from near-surface regionsLARSON, D. J; MILLER, M. K; ULFIG, R. M et al.Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 273-278, issn 0304-3991Conference Paper

A miniature, all-electrostatic, field emission electron column for surface analytical microscopyROBERTS, R. H; EL GOMATI, M. M; KUDJOE, J et al.Measurement science & technology (Print). 1997, Vol 8, Num 5, pp 536-545, issn 0957-0233Article

A practical method for real-time active modulation electron microscopy : Optimization of driving-signal for active accelerating-voltage modulationANDO, T; UTSURO, H; KIMURA, Y et al.Optik (Stuttgart). 1997, Vol 104, Num 4, pp 163-165, issn 0030-4026Article